Analysis of interface structures by quantitative high-resolution transmission electron microscopy

Materials Research Society Symposium - Proceedings

Volumn 466, Issue , 1997, Pages 95-106

  Kienzle, O ^a   Exner, M ^a   Ernst, F ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; IMAGE ANALYSIS; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

STRONTIUM TITANATE;

GRAIN BOUNDARIES;

EID: 0030674652     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)