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Volumn 146, Issue 1-6, 1998, Pages 309-315

Suppression of ageing effects in porous silicon interference filters

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; COMPUTER SIMULATION; LIGHT ABSORPTION; LIGHT INTERFERENCE; POROUS SILICON; REFLECTOMETERS; REFRACTIVE INDEX; THERMOOXIDATION;

EID: 0031650983     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00513-0     Document Type: Article
Times cited : (33)

References (38)
  • 10
    • 0347918331 scopus 로고    scopus 로고
    • Ph.D. thesis, RWTH Aachen
    • M.G. Berger, Ph.D. thesis, RWTH Aachen, 1996.
    • (1996)
    • Berger, M.G.1
  • 14
    • 0346657815 scopus 로고    scopus 로고
    • X-ray diffraction and reflectivity studies of thin porous silicon films
    • MRS Boston, to be published
    • D. Buttard, G. Dolino, D. Bellet, T. Baumbach, X-ray diffraction and reflectivity studies of thin porous silicon films, Mat. Res. Symp. Proceedings, MRS Boston 1996, to be published.
    • (1996) Mat. Res. Symp. Proceedings
    • Buttard, D.1    Dolino, G.2    Bellet, D.3    Baumbach, T.4
  • 37
    • 0346026718 scopus 로고    scopus 로고
    • private communication
    • V. Lehmann, private communication.
    • Lehmann, V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.