-
1
-
-
0023861977
-
Analysis of package cracking during reflow soldering process
-
April.
-
Kitano, M., Nishimura A., Kawei, S., "Analysis of Package Cracking During Reflow Soldering Process, " Proc 26, h IRPS, Monterey, CA, April. 1988, pp. 90-95.
-
(1988)
Proc 26, H IRPS, Monterey, CA
, pp. 90-95
-
-
Kitano, M.1
Nishimura, A.2
Kawei, S.3
-
2
-
-
0029214984
-
Effects of mold compound material properties on solder reflow package cracking
-
April
-
Groothuis, S. K., Heinen, K. G., Rimpillo, L. "Effects of Mold Compound Material Properties on Solder Reflow Package Cracking, ", Proc 33th IRPS, Las Vegas, April 1995, pp. 76-84
-
(1995)
Proc 33th IRPS, Las Vegas
, pp. 76-84
-
-
Groothuis, S.K.1
Heinen, K.G.2
Rimpillo, L.3
-
3
-
-
0023868087
-
Moisture induced package cracking in plastic encapsulated surface mount components during solder reflow process
-
April.
-
Lin, R., Blackshear, Serisky, P., "Moisture Induced Package Cracking in Plastic Encapsulated Surface Mount Components During Solder Reflow Process, " Proc 26, h IRPS, Monterey, CA, April. 1988, pp. 90-95.
-
(1988)
Proc 26, H IRPS, Monterey, CA
, pp. 90-95
-
-
Lin, R.1
Blackshear Serisky, P.2
-
4
-
-
0013292330
-
A j-integral criterion for delamination of bi-material interfaces incorporating hy-grothermal stress
-
ASME
-
T. Y. Lin, A. A. O. Tay, "A J-Integral Criterion for Delamination of Bi-Material Interfaces Incorporating Hy-grothermal Stress, " EEP-Vol. 19-2, Advances in Electronic Packaging, Vol. 2, ASME 1997, pp. 1421-1428
-
(1997)
EEP-19-2, Advances in Electronic Packaging
, vol.2
, pp. 1421-1428
-
-
Lin, T.Y.1
Tay, A.A.O.2
-
5
-
-
0026836469
-
Moisture sensivity characterization of plastic surface mount devices using scanning acoustic microscopy
-
April
-
Richard L. Shook, "Moisture Sensivity Characterization of Plastic Surface Mount Devices Using Scanning Acoustic Microscopy, " Proc 30, h IRPS, San Diego, April 1992, pp. 157-168
-
(1992)
Proc 30, H IRPS, San Diego
, pp. 157-168
-
-
Richard, L.1
Shook2
-
6
-
-
0028194812
-
Simplified and practical esti mation of package cracking during reflow soldering proc ess
-
April
-
K. Sawada, T. Nakazawa, N. Kawamura, K. Mat-sumoto, H. Hiruta, T. Sudo, "Simplified and Practical Esti mation of Package Cracking During Reflow Soldering Proc ess, " Proc 32th IRPS, San Jose, April 1994, pp. 114-119
-
(1994)
Proc 32th IRPS, San Jose
, pp. 114-119
-
-
Sawada, K.1
Nakazawa, T.2
Kawamura, N.3
Mat-Sumoto, K.4
Hiruta, H.5
Sudo, T.6
-
7
-
-
0028485053
-
Changing states of delamination between molding compound and chip surface: A challenge for scanning acoustic microscopy
-
Aug.
-
R. Tilgner; P. Alpern; J. Baumann, G. Pfannschmidt, O. Selig, "Changing States of Delamination Between Molding Compound and Chip Surface: A Challenge for Scanning Acoustic Microscopy", IEEE Trans. Comp., Packag, Manufact. Technol.-Part B, vol. 17, no. 3, (Aug. 1994), pp 442-448
-
(1994)
IEEE Trans. Comp., Packag, Manufact. Technol.-Part B
, vol.17
, Issue.3
, pp. 442-448
-
-
Tilgner, R.1
Alpern, P.2
Baumann, J.3
Pfannschmidt, G.4
Selig, O.5
-
8
-
-
0031346615
-
Hygrothermal reliability evaluation of plastic ic packages with computer-aided engineering tools
-
October
-
Kuo, A. Y., Nguyen, L. T, "Hygrothermal Reliability Evaluation of Plastic IC Packages with Computer-Aided Engineering Tools, " Proc. of First IEEE Int. Symp. Polymeric Electronic Packaging, NorrkOping, Sweden, October 1997, pp. 158-168
-
(1997)
Proc. of First IEEE Int. Symp. Polymeric Electronic Packaging, NorrkOping, Sweden
, pp. 158-168
-
-
Kuo, A.Y.1
Nguyen, L.T.2
-
9
-
-
3743089513
-
Effects of tem-perature and moisture upon the mechanical behavior of an epoxy molding compound EEP-19-1
-
ASME
-
B. D. Harper, L. Lu, V. H. Kenner, Effects of Tem-perature and Moisture Upon the Mechanical Behavior of an Epoxy Molding Compound EEP-Vol. 19-1, Advances in Electronic Packaging, Vol. 1, ASME 1997
-
(1997)
Advances in Electronic Packaging
, vol.1
-
-
Harper, B.D.1
Lu, L.2
Kenner, V.H.3
-
10
-
-
3643078785
-
Fracture strength of epoxy molding compounds
-
ASME
-
T.-R. Hsu, K. M. Fawzi, L. T. Nguyen and A-Y. Kuo, "Fracture strength of Epoxy Molding Compounds, " EEP-Vol. 19-1, Advances in Electronic Packaging, Vol. 1, ASME 1997, pp. 261-267
-
(1997)
EEP-19-1, Advances in Electronic Packaging
, vol.1
, pp. 261-267
-
-
Hsu, T.-R.1
Fawzi, K.M.2
Nguyen, L.T.3
Kuo, A.-Y.4
-
11
-
-
0031378977
-
FE-Simulation for polymeric packaging materials
-
Norrkoping, Sweden, October
-
R. Dudek, M. Scherzer, A. Schubert, B. Michel, "FE-Simulation for Polymeric Packaging Materials, " Proc. of First IEEE Int. Symp. Polymeric Electronic Packaging, Norrkoping, Sweden, October 1997, pp. 140-148
-
(1997)
Proc. of First IEEE Int. Symp. Polymeric Electronic Packaging
, pp. 140-148
-
-
Dudek, R.1
Scherzer, M.2
Schubert, A.3
Michel, B.4
-
12
-
-
0003395797
-
-
Pergamon PressPrentice-Hall (Oxford, New York
-
Murakami, Y. (ed:), Stress Intensity Factors Handbook. Pergamon PressPrentice-Hall (Oxford, New York, 1987), Vol. 1.
-
(1987)
Stress Intensity Factors Handbook
, vol.1
-
-
Murakami, Y.1
-
13
-
-
0029227962
-
A new criterion for package integrity under solder reflow conditions
-
May.
-
Nguyen, L. T., Chen, K. L., Schaefer, J., "A New Criterion for Package Integrity Under Solder Reflow Conditions, " Proc 45 Electronic Components and Technology Conf, May. 1995, pp. 478-490.
-
(1995)
Proc 45 Electronic Components and Technology Conf
, pp. 478-490
-
-
Nguyen, L.T.1
Chen, K.L.2
Schaefer, J.3
-
14
-
-
0026836354
-
X-ray analysis of the package cracking during reflow soldering
-
San Diego, April.
-
Harada, M., Tanigawa, S., Ohizumi, S., Ikemura, K., "X-ray Analysis of the Package Cracking During Reflow Soldering, " Proc 30lh IRPS, San Diego, April. 1992, pp. 182-189.
-
(1992)
Proc 30lh IRPS
, pp. 182-189
-
-
Harada, M.1
Tanigawa, S.2
Ohizumi, S.3
Ikemura, K.4
-
15
-
-
0027223816
-
A criterion for predicting delamination in plastic ic packages
-
March
-
Tay, A. A. O., Tan, G. L., Lim, T. B., "A Criterion for Predicting Delamination in Plastic IC Packages, " Proc 31s' IRPS, Atlanta, GA, March 1993, pp. 236-243
-
(1993)
Proc 31s' IRPS, Atlanta, GA
, pp. 236-243
-
-
Tay, A.A.O.1
Tan, G.L.2
Lim, T.B.3
-
17
-
-
0030257901
-
Mechanical failure in COB-technology using glob-top encapsulation
-
Oct.
-
R. Dudek; D. Vogel; B. Michel, "Mechanical Failure in COB-Technology Using Glob-Top Encapsulation", IEEE Trans. Comp., Packag., Manufact. Technol.-Vart C, vol. 19, no. 4, (Oct. 1996), pp 232-240
-
(1996)
IEEE Trans. Comp., Packag., Manufact. Technol.-Vart C
, vol.19
, Issue.4
, pp. 232-240
-
-
Dudek, R.1
Vogel, D.2
Michel, B.3
|