메뉴 건너뛰기




Volumn Part F133492, Issue , 1998, Pages 944-951

Investigations on popcorn cracking of T-QFP packages

Author keywords

[No Author keywords available]

Indexed keywords

FRACTURE MECHANICS; FRACTURE TOUGHNESS; HYDROSTATIC PRESSURE; NETWORK COMPONENTS; CRACK INITIATION; DELAMINATION; FINITE ELEMENT METHOD; INTERFACES (MATERIALS); PLASTIC MOLDS; STIFFNESS; STRESS ANALYSIS; THERMAL EFFECTS;

EID: 0031629059     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.1998.678822     Document Type: Conference Paper
Times cited : (8)

References (17)
  • 1
    • 0023861977 scopus 로고
    • Analysis of package cracking during reflow soldering process
    • April.
    • Kitano, M., Nishimura A., Kawei, S., "Analysis of Package Cracking During Reflow Soldering Process, " Proc 26, h IRPS, Monterey, CA, April. 1988, pp. 90-95.
    • (1988) Proc 26, H IRPS, Monterey, CA , pp. 90-95
    • Kitano, M.1    Nishimura, A.2    Kawei, S.3
  • 2
    • 0029214984 scopus 로고
    • Effects of mold compound material properties on solder reflow package cracking
    • April
    • Groothuis, S. K., Heinen, K. G., Rimpillo, L. "Effects of Mold Compound Material Properties on Solder Reflow Package Cracking, ", Proc 33th IRPS, Las Vegas, April 1995, pp. 76-84
    • (1995) Proc 33th IRPS, Las Vegas , pp. 76-84
    • Groothuis, S.K.1    Heinen, K.G.2    Rimpillo, L.3
  • 3
    • 0023868087 scopus 로고
    • Moisture induced package cracking in plastic encapsulated surface mount components during solder reflow process
    • April.
    • Lin, R., Blackshear, Serisky, P., "Moisture Induced Package Cracking in Plastic Encapsulated Surface Mount Components During Solder Reflow Process, " Proc 26, h IRPS, Monterey, CA, April. 1988, pp. 90-95.
    • (1988) Proc 26, H IRPS, Monterey, CA , pp. 90-95
    • Lin, R.1    Blackshear Serisky, P.2
  • 4
    • 0013292330 scopus 로고    scopus 로고
    • A j-integral criterion for delamination of bi-material interfaces incorporating hy-grothermal stress
    • ASME
    • T. Y. Lin, A. A. O. Tay, "A J-Integral Criterion for Delamination of Bi-Material Interfaces Incorporating Hy-grothermal Stress, " EEP-Vol. 19-2, Advances in Electronic Packaging, Vol. 2, ASME 1997, pp. 1421-1428
    • (1997) EEP-19-2, Advances in Electronic Packaging , vol.2 , pp. 1421-1428
    • Lin, T.Y.1    Tay, A.A.O.2
  • 5
    • 0026836469 scopus 로고
    • Moisture sensivity characterization of plastic surface mount devices using scanning acoustic microscopy
    • April
    • Richard L. Shook, "Moisture Sensivity Characterization of Plastic Surface Mount Devices Using Scanning Acoustic Microscopy, " Proc 30, h IRPS, San Diego, April 1992, pp. 157-168
    • (1992) Proc 30, H IRPS, San Diego , pp. 157-168
    • Richard, L.1    Shook2
  • 7
    • 0028485053 scopus 로고
    • Changing states of delamination between molding compound and chip surface: A challenge for scanning acoustic microscopy
    • Aug.
    • R. Tilgner; P. Alpern; J. Baumann, G. Pfannschmidt, O. Selig, "Changing States of Delamination Between Molding Compound and Chip Surface: A Challenge for Scanning Acoustic Microscopy", IEEE Trans. Comp., Packag, Manufact. Technol.-Part B, vol. 17, no. 3, (Aug. 1994), pp 442-448
    • (1994) IEEE Trans. Comp., Packag, Manufact. Technol.-Part B , vol.17 , Issue.3 , pp. 442-448
    • Tilgner, R.1    Alpern, P.2    Baumann, J.3    Pfannschmidt, G.4    Selig, O.5
  • 9
    • 3743089513 scopus 로고    scopus 로고
    • Effects of tem-perature and moisture upon the mechanical behavior of an epoxy molding compound EEP-19-1
    • ASME
    • B. D. Harper, L. Lu, V. H. Kenner, Effects of Tem-perature and Moisture Upon the Mechanical Behavior of an Epoxy Molding Compound EEP-Vol. 19-1, Advances in Electronic Packaging, Vol. 1, ASME 1997
    • (1997) Advances in Electronic Packaging , vol.1
    • Harper, B.D.1    Lu, L.2    Kenner, V.H.3
  • 12
    • 0003395797 scopus 로고
    • Pergamon PressPrentice-Hall (Oxford, New York
    • Murakami, Y. (ed:), Stress Intensity Factors Handbook. Pergamon PressPrentice-Hall (Oxford, New York, 1987), Vol. 1.
    • (1987) Stress Intensity Factors Handbook , vol.1
    • Murakami, Y.1
  • 14
    • 0026836354 scopus 로고
    • X-ray analysis of the package cracking during reflow soldering
    • San Diego, April.
    • Harada, M., Tanigawa, S., Ohizumi, S., Ikemura, K., "X-ray Analysis of the Package Cracking During Reflow Soldering, " Proc 30lh IRPS, San Diego, April. 1992, pp. 182-189.
    • (1992) Proc 30lh IRPS , pp. 182-189
    • Harada, M.1    Tanigawa, S.2    Ohizumi, S.3    Ikemura, K.4
  • 15
    • 0027223816 scopus 로고
    • A criterion for predicting delamination in plastic ic packages
    • March
    • Tay, A. A. O., Tan, G. L., Lim, T. B., "A Criterion for Predicting Delamination in Plastic IC Packages, " Proc 31s' IRPS, Atlanta, GA, March 1993, pp. 236-243
    • (1993) Proc 31s' IRPS, Atlanta, GA , pp. 236-243
    • Tay, A.A.O.1    Tan, G.L.2    Lim, T.B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.