Reliability of III-V based heterojunction bipolar transistors

Microelectronics Reliability

Volumn 38, Issue 1, 1998, Pages 153-161

  Christianson, K A ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE CURRENTS; RELIABILITY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SPURIOUS SIGNAL NOISE;

LOW-FREQUENCY NOISE;

HETEROJUNCTION BIPOLAR TRANSISTORS;

EID: 0031619639     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(97)00070-X     Document Type: Article

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