Reliability analysis of microwave GaAs/AlGaAs HBTs with beryllium and carbon doped base

IEEE MTT-S International Microwave Symposium Digest

Volumn 2, Issue , 1992, Pages 739-742

  Yamada, F M ^a   Oki, A K ^a   Streit, D C ^a   Saito, Y ^a   Umemoto, D K ^a   Tran, L T ^a   Bui, S ^a   Velebir, J R ^a   McIver, G W ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

DOPING (ADDITIVES); FAILURE ANALYSIS; HETEROJUNCTIONS; MICROWAVE DEVICES; RELIABILITY;

HBT RELIABILITY; MICROWAVE TRANSISTORS; SOLID STATE CIRCUITS;

BIPOLAR TRANSISTORS;

EID: 0027095191     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)