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Volumn 37, Issue 2, 1996, Pages 597-598
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Probing mechanical properties of polymers with AFM
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
FORCE MEASUREMENT;
MOLECULAR VIBRATIONS;
MULTILAYERS;
STIFFNESS;
SURFACE PROPERTIES;
HIGH RESOLUTION IMAGING;
SCANNING PROBE METHODS;
TIP TO SAMPLE FORCE INTERACTIONS;
POLYETHYLENES;
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EID: 0030204933
PISSN: 00323934
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (2)
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References (4)
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