Study of the surface local hardness and tip-force induced surface corrugation in layered tellurides NbGexTe2 (x = 1/3, 2/5, 3/7) and TaSi0.414Te2 by scanning tunneling microscopy

Surface Science

Volumn 365, Issue 2, 1996, Pages 461-472

  Bengel, H ^a   Cantow, H J ^a   Evain, M ^b   Magonov, S N ^c   Whangbo, M H ^d  

^a UNIVERSITY OF FREIBURG   (Germany)

^b UNIVERSITÉ DE NANTES   (France)

^c Digital Instruments   (United States)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

Metallic surfaces; Scanning tunneling microscopy; Semi empirical models and model calculations; Single crystal surfaces; Transition metal tellurides

Indexed keywords

ATOMS; CALCULATIONS; CARRIER CONCENTRATION; COMPUTER SIMULATION; ELECTRONIC DENSITY OF STATES; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTIES; SURFACE ROUGHNESS;

LAYERED TELLURIDES; TIP FORCE INDUCED SURFACE CORRUGATION;

TELLURIUM COMPOUNDS;

EID: 0030243905     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00726-1     Document Type: Article

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