Computation of the field diffracted by a local surface defect: Application to tip–sample interaction in the photon scanning tunneling microscope

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 13, Issue 5, 1996, Pages 944-951

  Weeber, J C ^a   de Fornel, F ^a   Goudonnet, J P ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; DEFECTS; DIELECTRIC MATERIALS; ELECTROMAGNETIC WAVE POLARIZATION; FOURIER TRANSFORMS; INTEGRAL EQUATIONS; MATHEMATICAL MODELS; REFRACTIVE INDEX; SCANNING TUNNELING MICROSCOPY; SURFACES;

AMPLITUDES; ELECTRICAL INTENSITY; PHOTON SCANNING TUNNELING MICROSCOPY; SURFACE DEFECT; TIP SAMPLE INTERACTION;

ELECTROMAGNETIC FIELD THEORY;

EID: 0030150752     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.13.000944     Document Type: Article

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