Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surface

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 12, Issue 12, 1995, Pages 2716-2725

  Carminati, Remi ^a   Greifet, Jean Jacques ^a  

^a CNRS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 70349683370     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.12.002716     Document Type: Article

References (39)

1. D. W. Pohl, “Scanning near-field optical microscopy,” in Ad-vances in Optical and Electron Microscopy, (C. Sheppard and T. Mulvey, eds. (Academic, London, 1990).
2. H. Heinzelmann and D. W. Pohl, “Scanningnear-field optical microscopy,” Appl. Phys. A 59, 89-101 (1994).
3. E. Bourillot, F. de Fornel, L. Salomon, P. M. Adam, and J.-P. Goudonnet, “Observation de structures guidantes en microscopie a effet tunnel photonique,” J. Opt. (Paris) 23, 57-62 (1992).
4. D. Courjon, C. Bainier, and M. Spajer, “Imaging of submi-cron index variations by scanning optical tunneling,” J. Vac. Sci. Technol. B 10, 2436-2439 (1992).
5. E. Betzig, P. L. Finn, and J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484-2486 (1992).
6. R. Toledo-Crow, P. C. Yang, Y. Chen, and M. Vaez-Iravani, “Near-field differential scanning optical microscope with atomic force regulation,” Appl. Phys. Lett. 60, 2957-2959 (1992).
7. D. Van Labeke and D. Barchiesi, “Scanning tunneling optical microscopy: A theoretical macroscopic approach,” J. Opt. Soc. Am. A 9, 732-739 (1992).
8. M. Neviere and P. Vincent, “Diffraction gratings as com-ponents for photon scanning tunneling microscope image interpretation,” in Near Field Optics, D. W. Pohl and D. Courjon, eds. (Kluwer, Dordrecht, The Netherlands, 1993), pp. 377-378.
9. N. Garcia and M. Nieto-Vesperinas, “Near-field optics inverse-scattering reconstruction of reflective surfaces,” Opt. Lett. 18, 2090-2092 (1993).
10. J.-J. Greffet, A. Sentenac, and R. Carminati, “Surface profile reconstruction using near field data,” Opt. Commun. 116 20-24 (1995).
11. N. Joachimowicz, C. Pichot, and J.-P. Hugonin, “Inverse scattering:an iterative numerical method for electro-magnetic imaging,” IEEE Trans. Antennas Propag. 29, 1742-1752 (1991).
12. E. Bourillot, F. de Fornel, J.-P. Goudonnet, D. Persegol, A. Kevorkian, and D. Delacourt, “Analysis of photon-scanning tunneling microscope images of inhomogeneous samples:determination of the local refractive index of channel waveguides,” J. Opt. Soc. Am. A 12, 95-106 (1995).
13. M. H. P. Moers, R. G. Tack, O. F. J. Noordman, F. B. Segerink, N. F. Van-Hulst, and B. Bolger, “Combined photon scanning tunneling microscope and atomic force microscope using silicon nitride probes,” in Near Field Optics, D. W. Pohl and D. Courjon, eds. (Kluwer, Dordrecht, The Nether-lands, 1993), pp. 79-86.
14. L. Novotny, D. W. Pohl, and P. Regli, “Light propagation through nanometer-sized structures: The two-dimensional- aperture scanning near-field optical microscope,” J. Opt. Soc. Am. A 11, 1768-1779 (1994).
15. D. Barchiesi and D. Van Labeke, “PSTM: An alternative to measure local variation of optical index,” Microsc. Microanal. Microstruct. 5, 435-446 (1994).
16. C. Girard and A. Dereux, “Optical spectroscopy of a surface at a nanometer scale:a heoretical study in real space,” Phys. Rev. B 49, 11, 334-11, 351 (1994).
17. J. Cites, M. F. M. Sanghadasa, C. S. Sung, R. C. Reddick, R. J. Warmack, and T. L. Ferrel, “Analysis of photon scan-ning tunneling microscope images,” J. Appl. Phys. 71, 7-10 (1992).
18. A. Sentenac and J.-J. Greffet, “Study of the features of the PSTM images by means of a perturbative approach,” Ultra-microscopy 57, 246-250 (1995).
19. U. Schollwock and H. Wagner, “A perturbation theory approach to scanning near field optical microscopy,” in Near Field Optics, D. W. Pohl and D. Courjon, eds. (Kluwer, Dordrecht, The Netherlands, 1993), pp. 247-254.
20. D. Van Labeke and D. Barchiesi, “Probes for scanning tunneling optical microscopy:a theoretical comparison,” J. Opt. Soc. Am. A 10, 2193-2201 (1993).
21. R. Carminati and J.-J. Greffet, “Two-dimensional numerical simulation of the photon scanning tunneling microscope: Concept of transfer function,” Opt. Commun. 116, 316-321 (1995).
22. F. de Fornel, P. M. Adam, L. Salomon, J.-P. Goudonnet, A. Sentenac, J.-J. Greffet, and R. Carminati, “Analysis of image formation with a photon scanning tunneling micro-scope,” J. Opt. Soc. Am. A (to be published).
23. D. Van Labeke, F. Baida, D. Barchiesi, and D. Courjon, “A theoretical model for the inverse scanning tunneling micro-scope (ISTOM),” Opt. Commun. 114, 470-480 (1995).
24. A. A. Maradudin and D. L. Mills, “Scattering and absorp-tion of electromagnetic radiation by a semi-infinite medium in the presence of surface roughness,” Phys. Rev. B 11, 1392-1415 (1975).
25. G. S. Agarwal, “Integral equation treatment of scattering from rough surfaces,” Phys. Rev. B 14, 846-848 (1976).
26. J.-J. Greffet. “Scattering of s-polarized electromagnetic waves by a 2D obstacle near an interface,” Opt. Commun. 72, 274-278 (1989).
27. F. Pincemin, A. Sentenac, and J.-J. Greffet, “Near field scat-tered by a dielectric rod below a metallic surface,” J. Opt. Soc. Am. A 11, 1117-1127 (1994).
28. R. F. Wallis and M. Balkanski, Many-Body Aspects of Solid State Spectroscopy (North-Holland, Amsterdam, 1986).
29. D. M. Wood and N. W. Ashcroft, “Quantum size effect in the optical properties of small metallic particles,” Phys. Rev. B 25, 6255-6274 (1982).
30. D. W. Oxtoby, F. Novak, and S. A. Rice, “The Ewald-Oseen theorem in the x-ray frequency region: A microscopic analy-sis,” J. Chem. Phys. 76, 5278-5282 (1982).
31. A. Sammar, J.-M. Andre, and B. Pardo, “Diffraction and scattering by lamellar amplitude multilayer gratings in the X-UV region,” Opt. Commun. 86, 245-254 (1991).
32. C. S. West and K. A. O’Donnell, “Observations of backscat-tering enhancement from polaritons on a rough metal sur-face,” J. Opt. Soc. Am. A 12, 390-397 (1995).
33. A. A Maradudin, A. R. McGurn, and E. R. Mendez, “Surface- plasmon polariton mechanism for the enhanced backscat-tering of light from one-dimensional randomly rough metal surfaces,” J. Opt. Soc. Am. A 12, 2500-2506 (1995).
34. K. Gottfried, Quantum Mechanics (Benjamin, New York, 1966).
35. C. Girard, A. Dereux, O. Martin, and M. Devel, “Importance of confined field in near-field optical imaging of subwave-length objects,” Phys. Rev. B 50, 14, 467-14, 473 (1994).
36. O. J. F. Martin, C. Girard, and A. Dereux, “Generalized field propagator for electromagnetic scattering and light confine-ment,” Phys. Rev. Lett. 74, 526-529 (1995).
37. M. Garcia-Parajo, J. Rosiu, and Y. Chen, “On the way to a multi-task near field optical microscope:simultaneous STM/SNOM and PSTM imaging,” Microsc. Microanal. Mi- crostruct. 5, 399-407 (1994).
38. G. S. Agarwal, “Scattering from rough surfaces,” Opt. Com-mun. 14, 161-166 (1975).
39. J. M. Elson, “Theory of light scattering from a rough sur-face with an inhomogeneous dielectric permittivity,” Phys. Rev. B 30, 5460-5480 (1984).