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Volumn 44, Issue 6 PART 3, 1997, Pages 2566-2570

Mapping high-pressure bridgman Cd0.8Zn0.2Te

Author keywords

Cdznte; High pressure bridgman

Indexed keywords

CRYSTAL GROWTH; ELECTRIC CURRENT MEASUREMENT; FLUORESCENCE; HIGH PRESSURE EFFECTS IN SOLIDS; LEAKAGE CURRENTS; PHOTOLUMINESCENCE; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

EID: 0031375444     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.650864     Document Type: Article
Times cited : (14)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.