Density and composition analysis using focused MeV ion mubeam techniques

Nuclear Inst. and Methods in Physics Research, A

Volumn 353, Issue 1-3, 1994, Pages 568-574

  Antolak, A J ^a   Bench, G S ^b   Pontau, A E ^a   Morse, D H ^a   Heikkinen, D W ^b   Weirup, D L ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001088863     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(94)91725-6     Document Type: Article

References (9)

1. Ion microbeam tomography