Comparison of single event phenomena for front/back irradiations

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2250-2255

  Musseau, V ^a,b   Ferlet Cavrois, A B ^b,c   Campbell, W J ^a,b   Stapor, P T ^a,c   McDonald, C ^a,b,c  

^a EA Bruyères le Châtel   (France)

^b NAVAL RESEARCH LABORATORY   (United States)

^c ICI   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CHARGE MEASUREMENT; ENERGY TRANSFER; INTEGRATED CIRCUIT TESTING; IONS; RADIATION EFFECTS;

CHARGE COLLECTION MEASUREMENT; LINEAR ENERGY TRANSFER (LET); SINGLE EVENT UPSET (SEU); STATIC RANDOM ACCESS MEMORY (SRAM);

RANDOM ACCESS STORAGE;

EID: 0031338739     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659043     Document Type: Article

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