Infrared scanning gap optical microscope with far field pickup

Optik (Jena)

Volumn 104, Issue 1, 1996, Pages 40-41

  Xiao, M ^a,c   Negrete Regagnon, P ^b   Siqueiros, J ^a,b,c  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

^b CENTRO DE INVESTIGACIÓN CIENTÍFICA Y DE EDUCACIÓN SUPERIOR DE ENSENADA   (Mexico)

^c Institute of Physics UNAM   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON DIOXIDE LASERS; LASER BEAMS; LIGHT REFLECTION; OPTICAL RESOLVING POWER; PROBES; SCANNING;

ONE-DIMENSIONAL REFLECTION SCANNING GAP OPTICAL MICROSCOPE;

OPTICAL MICROSCOPY;

EID: 0030282909     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (8)

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2. R. Bachelot, P. Gleyzes, A. C. Boccara: Near-field optical microscope based on local perturbation of a diffraction spot. Opt. Lett. 20 (1995) 1924-1926.
3. Y. Martin, F. Zenhausern, H. K. Wickramasinghe: Scattering spectroscopy of molecules at nanometer resolution. Appl. Phys. Lett. 68 (1996) 2475-2477, and the references therein.
4. A. A. Mardudin, A. Mendoza-Suárez, E. R. Méndez, M. Nieto-Vesperinas: A numerical study of a model near-field optical microscope, (private communication); A. A. Maradudin, E. R. Méndez: The utility of an impedance boundary condition in the scattering of light from one-dimensional randomly rough dielectric surfaces. Opt. Spektrosk. 80 (1996) 409-420.
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7. S. Wang, M. Xiao, J. Siqueiros: A macroscopic approach to near-field optical microscopy. J. Mod. Opt. (accepted for publication).
8. M. Xiao, S. Bozhevolnyi, O. Keller: Numerical study of configurational resonances in near field optical microscopy with a mesoscopic metallic probe. Appl. Phys. A 62 (1996) 115-121.