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Volumn 132, Issue 5-6, 1996, Pages 403-409
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A study of resolution limit in optical microscopy: Near and far field
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC WAVE DIFFRACTION;
LIGHT;
LIGHT INTERFERENCE;
LIGHT PROPAGATION;
NUMERICAL METHODS;
OPTICAL RESOLVING POWER;
EVANESCENT DIFFRACTION;
EVANESCENT FIELD DISTRIBUTION;
RESOLUTION LIMIT;
OPTICAL MICROSCOPY;
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EID: 0030408386
PISSN: 00304018
EISSN: None
Source Type: Journal
DOI: 10.1016/0030-4018(96)00323-9 Document Type: Article |
Times cited : (33)
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References (18)
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