![]() |
Volumn 37, Issue 10-11, 1997, Pages 1495-1498
|
Temperature and thermal conductivity modes of scanning probe microscopy for electromigration studies
|
Author keywords
[No Author keywords available]
|
Indexed keywords
MICROSCOPIC EXAMINATION;
PASSIVATION;
TEMPERATURE;
THERMAL CONDUCTIVITY;
THERMOCOUPLES;
THERMOMETERS;
PASSIVE TEMPERATURE SENSING PROBE;
SCANNING PROBE MICROSCOPY;
ELECTROMIGRATION;
|
EID: 0031251483
PISSN: 00262714
EISSN: None
Source Type: Journal
DOI: 10.1016/S0026-2714(97)00094-2 Document Type: Article |
Times cited : (7)
|
References (6)
|