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Volumn 37, Issue 10-11, 1997, Pages 1495-1498

Temperature and thermal conductivity modes of scanning probe microscopy for electromigration studies

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPIC EXAMINATION; PASSIVATION; TEMPERATURE; THERMAL CONDUCTIVITY; THERMOCOUPLES; THERMOMETERS;

EID: 0031251483     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(97)00094-2     Document Type: Article
Times cited : (7)

References (6)
  • 4
    • 0001267898 scopus 로고
    • Measurement of the electrical properties of electromigration specimens
    • B.K. Jones and Y.Z. Xu, Measurement of the electrical properties of electromigration specimens, Rev. Sci. Instrum. 66 4676-80, (1995).
    • (1995) Rev. Sci. Instrum. , vol.66 , pp. 4676-4680
    • Jones, B.K.1    Xu, Y.Z.2
  • 5
    • 0029502437 scopus 로고
    • Microscopic measurements of electromigration damage using electrical measurements
    • B.K. Jones, Microscopic Measurements of Electromigration Damage using Electrical Measurements, Mat. Res. Soc. Symp. Proc. 391 489-500 (1995).
    • (1995) Mat. Res. Soc. Symp. Proc. , vol.391 , pp. 489-500
    • Jones, B.K.1
  • 6
    • 0030193037 scopus 로고    scopus 로고
    • The evolution of the microscopic damage in electromigration studied by multiple electrical measurements
    • B.K. Jones, Y.Z. Xu and P. Zobbi, The evolution of the microscopic damage in electromigration studied by multiple electrical measurements, Microelectron. Reliab. 36 1051-62, (1996).
    • (1996) Microelectron. Reliab. , vol.36 , pp. 1051-1062
    • Jones, B.K.1    Xu, Y.Z.2    Zobbi, P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.