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Volumn 43, Issue 9, 1995, Pages 2151-2156

Interconnect Characterization Using Time-Domain Reflectometry

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CROSSTALK; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK TOPOLOGY; ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; ELECTROMAGNETIC WAVE TRANSMISSION; MATHEMATICAL MODELS; PRINTED CIRCUITS; RECURSIVE FUNCTIONS; TIME DOMAIN ANALYSIS;

EID: 0029373292     PISSN: 00189480     EISSN: 15579670     Source Type: Journal    
DOI: 10.1109/22.414553     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.