Development of on-wafer microstrip characterization techniques

47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996

Volumn , Issue , 1996, Pages 85-94

  Pham, A ^a   Laskar, J ^a   Schappacher, J ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b J Micro Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER AIDED DESIGN; MICROSTRIP DEVICES; SCATTERING PARAMETERS; SUBSTRATES; THICK FILMS;

CHARACTERIZATION TECHNIQUES; MEASURED RESULTS; MICROSTRIP TRANSITIONS; PRINTED WIRE BOARDS; REFERENCE PLANE; TEST METHODOLOGY; THICK-FILM MICROWAVES; TRL CALIBRATION;

THICK FILM DEVICES;

EID: 34648842934     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ARFTG.1996.327168     Document Type: Conference Paper

References (2)

1. A. Fraser and J. Schappacher, "Test Adapter Substrates Ease the Task of Measuring PHEMT FETs," Microwave Journal, vol. 38, pp 120-122, March 1995.
2. D. F. Williams and J. Schappacher, "Line-Reflect-match Calibrations with Nonideal Microstrip Standards," presented at 1995 Winter ARFTG Conference.