메뉴 건너뛰기




Volumn 44, Issue 7 PART 1, 1996, Pages 1140-1146

A circuit topology for microwave modeling of plastic surface mount packages

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC NETWORK TOPOLOGY; ELECTROMAGNETIC FIELD EFFECTS; ELECTROMAGNETIC WAVE SCATTERING; ELECTRONICS PACKAGING; FREQUENCIES; MATHEMATICAL MODELS; MONOLITHIC MICROWAVE INTEGRATED CIRCUITS; SURFACE MOUNT TECHNOLOGY; THREE DIMENSIONAL;

EID: 0030196466     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.508649     Document Type: Article
Times cited : (27)

References (6)
  • 2
    • 33747738307 scopus 로고    scopus 로고
    • Em and Emvu are trademarks of SONNET Inc., 135 Old Cove Road, Suite 203, Liverpool, NY
    • Em and Emvu are trademarks of SONNET Inc., 135 Old Cove Road, Suite 203, Liverpool, NY.
  • 3
    • 0028396428 scopus 로고
    • Synthesis of lumped models from N-port scattering parameter data
    • Mar.
    • J. C. Rautio, ;Synthesis of lumped models from N-port scattering parameter data,; IEEE Trans. Microwave Theory Tech., vol. 42, no. 3, pp. 535-537, Mar. 1994.
    • (1994) IEEE Trans. Microwave Theory Tech. , vol.42 , Issue.3 , pp. 535-537
    • Rautio, J.C.1
  • 5
    • 0028483362 scopus 로고
    • Wideband characterization of mutual coupling between high density bonding wires
    • Aug.
    • H. Y. Lee, ;Wideband characterization of mutual coupling between high density bonding wires,; IEEE Microwave Guided Wave Lett., vol. 4, no. 8, pp. 265-267, Aug. 1994.
    • (1994) IEEE Microwave Guided Wave Lett. , vol.4 , Issue.8 , pp. 265-267
    • Lee, H.Y.1
  • 6
    • 0029379296 scopus 로고
    • Parasitic impedance analysis of double bonding wires for high frequency integrated circuit packaging
    • Sept.
    • S. K. Yun and H. Y. Lee, ;Parasitic impedance analysis of double bonding wires for high frequency integrated circuit packaging,; IEEE Microwave Guided Wave Lett., vol. 5, no. 9, pp. 296-298, Sept. 1995.
    • (1995) IEEE Microwave Guided Wave Lett. , vol.5 , Issue.9 , pp. 296-298
    • Yun, S.K.1    Lee, H.Y.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.