Low-noise and high-speed charge detection in high-resolution CCD image sensors

IEEE Transactions on Electron Devices

Volumn 44, Issue 10, 1997, Pages 1679-1688

  Hynecek, Jaroslav ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DESIGN; OPTICAL RESOLVING POWER; SEMICONDUCTOR DEVICE STRUCTURES; SIGNAL PROCESSING; SPURIOUS SIGNAL NOISE;

FLOATING DIFFUSION STRUCTURE; FLOATING GATE CHARGE DETECTION STRUCTURE;

IMAGE SENSORS;

EID: 0031249043     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.628823     Document Type: Article

References (11)

1. W. F. Kosonocky and J. E. Carnes Two-phase charge-coupled devices with overlapping polysilicon and aluminum gates RCA Rev. vol. 34 pp. 164-202 1973.
2. N. Mutoh M. Morimoto M. Nishimura N. Teranishi and E. Oda New low-noise output amplifier for high-definition CCD image sensor in IEDM Tech. Dig. 1989 pp. 173-176.
3. E. Roks P. G. M. Centen J. T. Bosiers and W. F. Huinink The double-sided floating-surface detector: An enhanced charge-detection architecture for CCD image sensors IEEE Trans. Electron Devices vol. 43 pp. 1583-1591 Sept. 1996.
4. J. Hynecek Spectral analysis of reset noise observed in CCD charge detection circuits IEEE Trans. Electron Devices vol. 37 pp. 640-647 Mar. 1990.
5. M. H. White D. R. Lampe F. C. Blaha and I. A. Mack Characterization of surface channel CCD image arrays at low light levels IEEE J. Solid-State Circuits vol. SC-9 pp. 1-13 Feb. 1974.
6. N. Teranishi and N. Mutoh Partition noise in CCD signal detection IEEE Trans. Electron Devices vol. ED-33 pp. 1696-1701 Nov. 1986.
7. D. D. Wen J. M. Early C.-K. Kim and G. F. Amelio A distributed floating-gate amplifier in charge-coupled devices in ISSCC Dig. Tech. Papers 1975 pp. 24-25.
8. J. Hynecek Design and performance of a low-noise charge detection amplifier for VPCCD devices IEEE Trans. Electron Devices vol. ED-31 pp. 1713-1719 Dec. 1984.
9. _ Theoretical analysis and optimization of CDS signal processing method for CCD image sensors IEEE Trans. Electron Devices vol. 39 pp. 2497-2507 Nov. 1992.
10. A. van der Ziel Noise in Solid-State Devices and Circuits. New York: Wiley 1986.
11. Image Sensor Technology Center: Area Array Image Sensor Products Data Book Texas Instruments Inc. Dallas TX 1996.