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Volumn 39, Issue 11, 1992, Pages 2497-2507

Theoretical Analysis and Optimization of CDS Signal Processing Method for CCD Image Sensors

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CHARGE COUPLED DEVICES; CORRELATION DETECTORS; EQUIVALENT CIRCUITS; FOURIER TRANSFORMS; LOW PASS FILTERS; OPTIMIZATION; SIGNAL PROCESSING; SIGNAL TO NOISE RATIO; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; TRANSFER FUNCTIONS;

EID: 0026954427     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/16.163448     Document Type: Article
Times cited : (34)

References (14)
  • 1
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    • M. H. White, D. R. Lampe, F. C. Blaha, and I. A. Mack “Characterization of surface channel CCD image arrays at low light levels,” IEEE J. Solid-State Circuits, vol. SC-9, pp. 1–13, Feb. 1974.
    • (1974) IEEE J. Solid-State Circuits , vol.SC-9 , pp. 1-13
    • White, M.H.1    Lampe, D.R.2    Blaha, F.C.3    Mack, I.A.4
  • 2
    • 0022733931 scopus 로고
    • High-resolution 8-mm CCD image sensor with correlated clamp sample and hold charge detection circuit
    • June
    • J. Hynecek “High-resolution 8-mm CCD image sensor with correlated clamp sample and hold charge detection circuit,” IEEE Trans. Electron Devices, vol. ED-33, pp. 850–862, June 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 850-862
    • Hynecek, J.1
  • 3
    • 84941535889 scopus 로고
    • Noise suppression method for high-resolution CCD Camera
    • Feb.
    • M. Ohbo, S. Yamamoto, and I. Akiyama “Noise suppression method for high-resolution CCD Camera,” ITEJ Tech. Rep., vol. 13, pp. 7–12, Feb. 1989.
    • (1989) ITEJ Tech. Rep. , vol.13 , pp. 7-12
    • Ohbo, M.1    Yamamoto, S.2    Akiyama, I.3
  • 4
    • 0024718241 scopus 로고
    • A new noise suppression method for high-definition CCD cameras
    • June
    • M. Ohbo, I. Akiyama, and T. Tanaka “A new noise suppression method for high-definition CCD cameras,” IEEE Trans. Consumer Electron., vol. 35, pp. 368–374, June 1989.
    • (1989) IEEE Trans. Consumer Electron. , vol.35 , pp. 368-374
    • Ohbo, M.1    Akiyama, I.2    Tanaka, T.3
  • 6
    • 0019027110 scopus 로고
    • Response of a correlated double sampling circuit to 1/f noise
    • June
    • R. J. Kansy “Response of a correlated double sampling circuit to 1/f noise,” IEEE J. Solid-State Circuits, vol. SC-15, pp. 373–375, June 1980.
    • (1980) IEEE J. Solid-State Circuits , vol.SC-15 , pp. 373-375
    • Kansy, R.J.1
  • 7
    • 0026220446 scopus 로고
    • The output power spectrum produced by correlated double sampling
    • Sept
    • J. M. Pimbley and G. J. Michon “The output power spectrum produced by correlated double sampling,” IEEE Trans. Circuit Syst., vol. 38, pp. 1086–1090, Sept. 1991.
    • (1991) IEEE Trans. Circuit Syst. , vol.38 , pp. 1086-1090
    • Pimbley, J.M.1    Michon, G.J.2
  • 8
    • 0025403214 scopus 로고
    • Spectral analysis of reset noise observed in CCD charge detection circuits
    • Mar
    • J. Hynecek, “Spectral analysis of reset noise observed in CCD charge detection circuits,” IEEE Trans. Electron Devices, vol. 37, pp. 640–647, Mar. 1990.
    • (1990) IEEE Trans. Electron Devices , vol.37 , pp. 640-647
    • Hynecek, J.1
  • 10
    • 0022809985 scopus 로고
    • Partition noise in CCD signal detection
    • Nov
    • N. Teranishi and N. Mutoh “Partition noise in CCD signal detection,” IEEE Trans. Electron Devices, vol. ED-33, pp. 1696–1701, Nov. 1986.
    • (1986) IEEE Trans. Electron Devices , vol.ED-33 , pp. 1696-1701
    • Teranishi, N.1    Mutoh, N.2
  • 12
    • 0019612442 scopus 로고
    • Spectral distribution of a sampled 1st-order low-pass filtered white noise
    • Sept
    • C. A. Gobet “Spectral distribution of a sampled 1st-order low-pass filtered white noise,” Electron. Lett., vol. 17, pp. 720–721, Sept. 1981.
    • (1981) Electron. Lett. , vol.17 , pp. 720-721
    • Gobet, C.A.1
  • 13
    • 0026154081 scopus 로고
    • CCD on-chip amplifiers: Noise performance versus MOS transistor dimensions
    • May
    • P. Centen “CCD on-chip amplifiers: Noise performance versus MOS transistor dimensions,” IEEE Trans. Electron Devices, vol. 38, pp. 1206–1216, May 1991.
    • (1991) IEEE Trans. Electron Devices , vol.38 , pp. 1206-1216
    • Centen, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.