Partition Noise in CCD Signal Detection

IEEE Transactions on Electron Devices

Volumn 33, Issue 11, 1986, Pages 1696-1701

  Teranishi, Nobukazu ^a   Mutoh, Nobuhiko ^a  

^a NEC CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE SENSORS; SIGNAL DETECTION - MATHEMATICAL MODELS;

CCD SIGNAL DETECTION; PARTITION NOISE; RESET NOISE MEASUREMENT;

SEMICONDUCTOR DEVICES, CHARGE COUPLED;

EID: 0022809985     PISSN: 00189383     EISSN: 15579646     Source Type: Journal    
DOI: 10.1109/T-ED.1986.22730     Document Type: Article

References (3)

1. M, H. White, D. R. Lampe, F. C. Blaha, and I. A. Mack “Characterization of surface channel CCD imaging arrays at low light levels,” IEEE J. Solid-State Circuits, vol. SC-9, pp. 1–13, 1974.
2. J. E. Carnes and W. F. Kosonocky “Noise sources in charge-coupled devices,” RCA Rev., vol. 33, pp. 327–343, 1972.
3. C-K. Kim and M. Lenzlinger “Charge transfer in charge-coupled devices,” J. Appl. Phys., vol. 42, pp. 3586–3594, 1971.