Characterization of Surface Channel CCD Image Arrays at Low Light Levels

IEEE Journal of Solid-State Circuits

Volumn 9, Issue 1, 1974, Pages 1-12

  White, Marvin H ^a   Blaha, Franklyn C ^a   Lampe, Donald R ^a   Mack, Ingham A ^a  

^a WESTINGHOUSE ELECTRIC COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PHOTOCONDUCTING DEVICES;

SEMICONDUCTOR DEVICES;

EID: 0016027413     PISSN: 00189200     EISSN: 1558173X     Source Type: Journal    
DOI: 10.1109/JSSC.1974.1050448     Document Type: Article

References (13)

1. W. S. Boyle and G. E. Smith, “Chargecoupled semiconductor devices” Bell Syst. Tech. J., vol. 49, p. 587, 1970.
2. G. F. Amelio, M. F. Tompsett, and G. E. Smith, “Experimental verification of the charge coupled device concept” Bell Syst. Tech. J., vol. 49, p. 593, 1970.
3. M. F. Tompsett, “The quantitative effects of interface states on the performance of CCD's” presented at the Int. Electron Devices Meeting, Washington, D. C., Oct. 1971 also Tech. Papers Abstracts, p. 70, and IEEE Trans. Electron Devices, vol. ED-20, pp. 4555, Jan. 1973.
4. W. B. Joyce and W. J. Bertram, “Linearized dispersion relation and Green's function for discrete charge transfer devices with incomplete transfer Bell Syst. Tech. J., vol. 50, p. 1741, 1971.
5. M. H. White, D. R. Lampe, F. C. Blaha, and I. A. Mack, “Charge coupled deVice (CCD) imaging at low light levels” presented at the IEEE Int. Electron Devices Meeting, Washington, D. C., 1972. “Characterization of charge coupled device line and area-array imaging at low light levels presented at the IEEE Int. Solid-State Circuit Conf., Philadelphia, Pa., 1973.
6. R. H. Dyck, and G. P. Weckler, “A new self-scanned photodiode array” Solid-State Technol., p. 37, July 1971.
7. M. Ashikawa, N. Koike, T. Kamiyama, and S. Kubo, “A new splice noise elimination technique for photosensitive arrays, presented at the IEEE Int. Solid-State Circuits Conf., Philadelphia, Pa. 1973.
8. J. E. Carnes and W. F. Kosonocky, “Noise sources in charge-coupled devices” RCA Rev., vol. 33, p. 327, 1972.
9. D. F. Barbe, “Noise and distortion considerations in charge-coupled devices.” Electron. Lett., vol. 8, p. 207, 1972.
10. J. D. Plummer and J. D. Meindl, “MOS electronics for a portable reading aid for the blind IEEE J. Solid-State Circuits, vol. SC-7, pp. 111120, Apr. 1972.
11. J. A. Betts, Signal Processing, Modulation and Noise. New York: Elsevier, 1971.
12. K. K. Thornber and M. F. Tompsett, “Spectral density of noise generated in charge transfer devices,” IEEE Trans. Electron Devices, vol. ED-20, p. 456, Apr. 1973.
13. S. P. Emmons and D. D. Buss, “Techniques for introducing a low noise fat zero in CCD's,” presented at the Device Res. Conf., Boulder, Colo,, June 1973.