Morphology and X-ray diffraction peak widths of aluminum nitride single crystals prepared by the sublimation method

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 36, Issue 8 SUPPL. B, 1997, Pages

  Tanaka, Motoyuki ^a   Nakahata, Seiji ^a   Sogabe, Kouichi ^a   Nakata, Hirohiko ^a   Tobioka, Masaaki ^a  

^a SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

AlN; Bulk; Characterization; Nitride; Rocking curve; Single crystal; Sublimation

Indexed keywords

ALUMINUM COMPOUNDS; CRYSTAL GROWTH; CRYSTAL ORIENTATION; MORPHOLOGY; SEMICONDUCTOR LASERS; SUBLIMATION; SUBSTRATES; TRANSPARENCY; X RAY CRYSTALLOGRAPHY;

ALUMINUM NITRIDE; ROCKING CURVES;

SINGLE CRYSTALS;

EID: 0031210558     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.36.l1062     Document Type: Article

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