An angle-resolved XPS study of the in-depth structure of passivated amorphous aluminum alloys

Corrosion Science

Volumn 39, Issue 8, 1997, Pages 1351-1364

  Akiyama, E ^a   Kawashima, A ^a   Asami, K ^a   Hashimoto, K ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

A. alloy; A. aluminum; B. XPS; C. amorphous structures; C. passive film

Indexed keywords

AMORPHOUS ALLOYS; CHROMIUM; COMPOSITION; CORROSION RESISTANT ALLOYS; PASSIVATION; SPUTTER DEPOSITION; TITANIUM; X RAY PHOTOELECTRON SPECTROSCOPY;

AMORPHOUS STRUCTURES; ANGLE RESOLVED X RAY PHOTOELECTRON SPECTROSCOPY; IN DEPTH STRUCTURE; PASSIVE FILM;

ALUMINUM ALLOYS;

EID: 0031206790     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0010-938X(97)00034-6     Document Type: Article

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