A study of the structure of a passive film using angle-resolved x-ray photo-electron spectroscopy

Corrosion Science

Volumn 38, Issue 7, 1996, Pages 1127-1140

  Akiyama, E ^a   Kawashima, A ^a   Asami, K ^a   Hashimoto, K ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

A. alloy; A. aluminum; B. XPS; C. amorphous structures; C. passive films

Indexed keywords

ALUMINUM ALLOYS; AMORPHOUS ALLOYS; CHARACTERIZATION; CORROSION RESISTANCE; DIFFUSION; DISSOLUTION; HYDROCHLORIC ACID; IONS; MATHEMATICAL MODELS; PASSIVATION; STRUCTURE (COMPOSITION); X RAY PHOTOELECTRON SPECTROSCOPY;

CATIONS; MIGRATION; PASSIVE FILM;

PROTECTIVE COATINGS;

EID: 0030190997     PISSN: 0010938X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0010-938X(96)81813-0     Document Type: Article

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