Economic cost modeling of environmental-stress-screening and burn-in

IEEE Transactions on Reliability

Volumn 46, Issue 2, 1997, Pages 275-282

  Yan, Li ^a   English, John R ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

Burnin; Environmental stress screening (ESS); Latent failure

Indexed keywords

ELECTRONICS INDUSTRY; FAILURE ANALYSIS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS;

BURN IN; ENVIRONMENTAL STRESS SCREENING (ESS); LATENT FAILURE;

RELIABILITY;

EID: 0031166257     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.589957     Document Type: Article

References (10)

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