Burn-in Optimization under Reliability & Capacity Restrictions

IEEE Transactions on Reliability

Volumn 38, Issue 2, 1989, Pages 193-198

  Chi, Dong Hae ^a   Kuo, Way ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

Burn in; Randomized pattern search

Indexed keywords

DECISION THEORY AND ANALYSIS; RELIABILITY;

BURN-IN OPTIMIZATION; BURN-IN SCREENING; DECISION TREE; RANDOMIZED PATTERN SEARCH; RELIABILITY/CAPACITY CONSTRAINTS;

ELECTRONIC EQUIPMENT TESTING;

EID: 0024686380     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/24.31104     Document Type: Article

References (10)

1. F. Jensen, N.E. Peterson, Burn-In, John Wiley & Sons Ltd., 1982.
2. Way Kuo, Y. Kuo, “Facing the headaches of early failures: A state-of-the art review of burn-in decisions”, Proc. IEEE, vol 71, 1983 Nov, pp. 1257–1266.
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5. Way Kuo, “Reliability enhancement through optimal burn-in”, IEEE Trans. Reliability, vol R-33, 1984 Jun, pp. 145–156.
6. B. Fox, “Total annual cost, A reliability criterion”, Proc. Nat. Symp. Reliability and Qual. Control, 1964, pp. 266–273.
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10. F.A. Tillman, C.L. Hwang, Way Kuo, Optimization of Systems Reliability, Marcel Dekker, 1981.