Reliability Enhancement Through Optimal Burn-In

IEEE Transactions on Reliability

Volumn R-33, Issue 2, 1984, Pages 145-156

  Kuo, Way ^a  

^a IOWA STATE UNIVERSITY   (United States)

Author keywords

Burn in Weibull distribution; Generalized Reduced Gradient (GRG) Method; keywords; Optimization

Indexed keywords

BURN-IN; GENERALIZED REDUCED GRADIENT (GRG) METHOD; WEIBULL DISTRIBUTION;

INTEGRATED CIRCUITS;

EID: 0021443115     PISSN: 00189529     EISSN: 15581721     Source Type: Journal    
DOI: 10.1109/TR.1984.5221760     Document Type: Article

References (17)

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