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Volumn 175-176, Issue PART 1, 1997, Pages 117-121
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Studies of GaN layers grown on sapphire using an RF-source
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL DEFECTS;
ENERGY GAP;
EXCITONS;
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
PLASMA SOURCES;
PYROMETERS;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SAPPHIRE;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTOR GROWTH;
SUBSTRATES;
GALLIUM NITRIDE;
SEMICONDUCTING FILMS;
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EID: 0031147001
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(96)01221-3 Document Type: Article |
Times cited : (3)
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References (16)
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