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Volumn 55, Issue 3, 1997, Pages 3450-3459

Langmuir probe measurements in an inductively coupled plasma source

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC DISCHARGES; ELECTRODES; ELECTRON DENSITY MEASUREMENT; INERT GASES; NITROGEN; OXYGEN; PLASMA SOURCES; PROBES; TEMPERATURE MEASUREMENT;

EID: 0031101854     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.55.3450     Document Type: Article
Times cited : (115)

References (35)
  • 1
    • 85035199152 scopus 로고    scopus 로고
    • U.S. Patent 4.948.458 (14 August 1990)
    • J S. Ogle, U.S. Patent No. 4.948.458 (14 August 1990).
    • Ogle, J.S.1
  • 22
    • 0003494736 scopus 로고
    • W. Lochte-Holtgreven, North-Holland, Amsterdam, in, edited by
    • L. Schott, in Plasma Diagnostics, edited by W. Lochte-Holtgreven (North-Holland, Amsterdam, 1968).
    • (1968) Plasma Diagnostics
    • Schott, L.1
  • 23
    • 85035202926 scopus 로고
    • Arbeitssgemeinschatft Plasmaphysik, Bochum: (in German)
    • M. Petig, Report No. 92-17-24, SFB Neidertemperaturplasmen (Arbeitssgemeinschatft Plasmaphysik, Bochum, 1992) (in German).
    • (1992) SFB Neidertemperaturplasmen
    • Petig, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.