Shear force imaging of DNA in a near-field scanning optical microscope (NSOM)

Journal of Microscopy

Volumn 185, Issue 3, 1997, Pages 396-401

  Kirsch, A K ^a   Meyer, C K ^a   Jovin, T M ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

NSOM; Scanning force microscope; SFM; Shear force; SNOM

Indexed keywords

ATOMIC FORCE MICROSCOPY; FEEDBACK; MICA; MICROSCOPES; OPTICAL FIBERS; PIEZOELECTRIC ACTUATORS;

NANOSCOPES; NEAR-FIELD SCANNING; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; OPTICAL MODULES; PROBE MICROSCOPE; SCANNING FORCE MICROSCOPES; SCANNING OPTICAL; SCANNING PROBES; SFM; SHEAR FORCE;

DNA;

DNA;

ARTICLE; PRIORITY JOURNAL; SCANNING FORCE MICROSCOPY;

MICA;

EID: 0030941182     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1997.d01-634.x     Document Type: Article

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