Charge-sensitive amplifier front-end with an njfet and a forward-biased reset diode

IEEE Transactions on Nuclear Science

Volumn 43, Issue 6 PART 2, 1996, Pages 3218-3222

  Fazzi, A ^a   Jalas, P ^a   Rehak, P ^a   Holl, P ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

JUNCTION GATE FIELD EFFECT TRANSISTORS; LEAKAGE CURRENTS; SEMICONDUCTOR DIODES; SEMICONDUCTOR JUNCTIONS; SILICON SENSORS; SPURIOUS SIGNAL NOISE;

CHARGE AMPLIFIERS; DRIFT DETECTORS;

AMPLIFIERS (ELECTRONIC);

EID: 0030362199     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.552721     Document Type: Article

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