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Volumn 19, Issue 1, 1972, Pages 403-411

Drain feedback - a novel feedback technique for low-noise cryogenic preamplifiers

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS, FEEDBACK; CRYOGENICS; TRANSISTORS, FIELD EFFECT;

EID: 0015298340     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1972.4326541     Document Type: Article
Times cited : (39)

References (22)
  • 5
    • 84941478460 scopus 로고    scopus 로고
    • unpublished.
    • E. Elad, unpublished.
    • Elad, E.1
  • 6
    • 84941468610 scopus 로고
    • Report BNL-12748
    • V. Radeka, Report BNL-12748, 1968.
    • (1968)
    • Radek, V.1
  • 7
    • 84941461773 scopus 로고
    • Semiconductor Nuclear Particle Detectors and Circuits, National Academy of Sciences, Publication 1593, Washington, D. C.
    • K. L. Kandiah and A. D. Stirling, Semiconductor Nuclear Particle Detectors and Circuits, National Academy of Sciences, Publication 1593, Washington, D. C. (1969), 495.
    • (1969) , pp. 495
    • Kandiah, K.L.1    Stirling, A.D.2
  • 10
    • 84941482145 scopus 로고
    • E. Elad, Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis, ASTM Publication 485, American Society for Testing and Materials (1971), 57–81. Presented at the 73rd Meeting of the American Society for Testing and Materials, Toronto, Canada 21–26 June
    • E. Elad, Energy Dispersion X-Ray Analysis: X-Ray and Electron Probe Analysis, ASTM Publication 485, American Society for Testing and Materials (1971), 57–81. Presented at the 73rd Meeting of the American Society for Testing and Materials, Toronto, Canada 21–26 June 1970.
    • (1970)
    • Elad, E.1
  • 11
    • 84941434788 scopus 로고    scopus 로고
    • Preliminary results reported in Reference 10
    • Preliminary results reported in Reference 10.
  • 12
    • 84941449334 scopus 로고    scopus 로고
    • Possibility mentioned in Reference 9.
    • Possibility mentioned in Reference 9.
  • 19
    • 0014618472 scopus 로고
    • R. D. Ryan, Proc. of IEEE 57, No. 6 (1969), 1225.
    • (1969) Proc. of IEEE , vol.57 , Issue.6 , pp. 1225
    • Ryan, O.1
  • 22
    • 84941453891 scopus 로고
    • Light Element Analysis with Si(Li) X-Ray Energy Analyzers
    • presented at the VIth International Conference on X-Ray Optics and Microanalysis, Osaka, Japan.
    • Emanuel Elad and Dale A. Gedcke, “Light Element Analysis with Si(Li) X-Ray Energy Analyzers”, presented at the VIth International Conference on X-Ray Optics and Microanalysis, September 5–10, 1971, Osaka, Japan.
    • (1971)
    • Elad, E.1    Gedcke, D.A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.