High resolution X-ray spectroscopy with silicon drift detectors and integrated electronics

Nuclear Inst. and Methods in Physics Research, A

Volumn 322, Issue 3, 1992, Pages 538-542

  Bertuccio, G ^a   Sampietro, M ^a   Fazzi, A ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001069609     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(92)91228-2     Document Type: Article

References (13)

1. Low-Noise Techniques in Detectors
2. Proc. SPIE, Vol. 1344, EUV