Room Temperature X ray Spectroscopy with a Silicon Diode Detector and an Ultra Low Noise Preamplifier

IEEE Transactions on Nuclear Science

Volumn 41, Issue 4, 1994, Pages 1704-1709

  Bertuccio, G ^a   Pullia, A ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

MULTICHANNEL DETECTORS; ROOM TEMPERATURE OPERATION; SILICON DIODE DETECTOR; SILICON PLANAR DIODE DETECTOR; ULTRA LOW NOISE PREAMPLIFIER;

AMPLIFIERS (ELECTRONIC); ELECTRONS; FIELD EFFECT TRANSISTORS; LEAKAGE CURRENTS; LOW TEMPERATURE OPERATIONS; SILICON SENSORS; SPURIOUS SIGNAL NOISE; X RAY SPECTROGRAPHS;

X RAY SPECTROSCOPY;

EID: 0028493943     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.322776     Document Type: Article

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