Ion-Beam-Induced Morphology on the Surface of Thin Polymer Films at Low Current Density and High Ion Fluence

Journal of Polymer Science, Part B: Polymer Physics

Volumn 39, Issue 3, 2001, Pages 314-325

  Netcheva, Stoyka ^a,b   Bertrand, Patrick ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b YORK UNIVERSITY   (Canada)

Author keywords

Atomic force microscopy; Ion beam irradiation; Thin polymer films; Time of flight secondary ion mass spectrometry

Indexed keywords

EID: 0012640605     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/1099-0488(20010201)39:3<314::AID-POLB1003>3.0.CO;2-6     Document Type: Article

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