Surface topography development of thin polystyrene films under low energy ion irradiation

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 151, Issue 1-4, 1999, Pages 129-134

  Netcheva, Stoyka ^a   Bertrand, Patrick ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON BLACK; MORPHOLOGY; POLYSTYRENES; SECONDARY ION MASS SPECTROMETRY; SPUTTERING; SURFACE ROUGHNESS; THIN FILMS; XENON;

LOW ENERGY ION IRRADIATION; THIN POLYSTYRENE FILMS;

ION BOMBARDMENT;

EID: 0033515967     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00145-7     Document Type: Article

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