Carbon black surface characterization by tof-sims and XPS

Rubber Chemistry and Technology

Volumn 72, Issue 2, 1999, Pages 384-397

  Bertrand, P ^a   Weng, L T ^a,b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000081842     PISSN: 00359475     EISSN: None     Source Type: Journal    
DOI: 10.5254/1.3538809     Document Type: Article

References (25)

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