Investigation of ion bombarded polymer surfaces using SIMS, XPS and AFM

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 121, Issue 1-4, 1997, Pages 474-479

  Lee, Jong Wan ^a   Kim, T H ^a   Kim, S H ^a   Kim, C Y ^a   Yoon, Y H ^b   Lee, J S ^b   Han, J G ^b  

^a LG Electronics Inc   (South Korea)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

ARGON; HYDROGEN; ION BEAMS; ION BOMBARDMENT; IONIZATION; POLYETHYLENES; POLYIMIDES; POLYSTYRENES; SURFACE TREATMENT;

SURFACE MODIFICATION;

POLYMERS;

EID: 0031546233     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(96)00584-8     Document Type: Article

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