Defect-related local-electric-field impact on p-n junction parameters

Applied Physics Letters

Volumn 75, Issue 25, 1999, Pages 3971-3973

  Czerwinski, A ^a  

^a Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0012283362     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125510     Document Type: Article

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