Two-beam interferometer for measuring aberrations of optical components with axial symmetry

Applied Optics

Volumn 40, Issue 10, 2001, Pages 1631-1636

  Nicola, Sergio De ^a   Ferraro, Pietro ^a,b   Finizio, Andrea ^a   Pierattini, Giovanni ^a  

^a CNR   (Italy)

^b ISTITUTO NAZIONALE DI OTTICA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; CHARGE COUPLED DEVICES; LIGHT INTERFERENCE; WAVEFRONTS;

FRINGE PATTERNS;

INTERFEROMETERS;

EID: 0011580545     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.40.001631     Document Type: Article

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