A two-dimensional fast Fourier transform method for measuring the inclination angle of parallel fringe patterns

Optics and Laser Technology

Volumn 30, Issue 3-4, 1998, Pages 167-173

  De Nicola, S ^a   Ferraro, P ^a,b  

^a CNR   (Italy)

^b Ist Prof Stato per l'Indust l'A   (Italy)

Author keywords

Fourier transform; Interferogram processing; Phase retrieval

Indexed keywords

ALGORITHMS; ERROR ANALYSIS; FAST FOURIER TRANSFORMS; INTERFEROMETRY; PATTERN RECOGNITION;

INTERFEROGRAM PROCESSING;

IMAGE ANALYSIS;

EID: 0032035594     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(98)00028-0     Document Type: Article

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