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Volumn 57, Issue 2, 1999, Pages 161-164

Enhanced diffusion of platinum in electron-irradiated silicon

Author keywords

DLTS; Electron irradiation; Enhanced diffusion; Platinum; Vacancy

Indexed keywords

BAND STRUCTURE; DEEP LEVEL TRANSIENT SPECTROSCOPY; ELECTRON IRRADIATION; INTERDIFFUSION (SOLIDS); PLATINUM;

EID: 0011142033     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(98)00315-8     Document Type: Article
Times cited : (8)

References (14)
  • 12
    • 11644316453 scopus 로고    scopus 로고
    • Deep levels of metal impurities in silicon
    • Properties of Silicon, in press
    • W. Schröter, M. Seibt, Deep Levels of Metal Impurities in Silicon, in: EMIS data reviews series, Properties of Silicon, in press.
    • EMIS Data Reviews Series
    • Schröter, W.1    Seibt, M.2
  • 13
    • 0346150774 scopus 로고    scopus 로고
    • Energy levels, structure, and properties of point defects induced by ion-implantation and electron-irradiation
    • Properties of Silicon, in press
    • B.G. Svensson, Energy Levels, Structure, and Properties of Point Defects Induced by Ion-Implantation and Electron-Irradiation, in: EMIS data reviews series, Properties of Silicon, in press.
    • EMIS Data Reviews Series
    • Svensson, B.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.