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Volumn 86, Issue 4, 1999, Pages 1958-1964

Thickness dependence of the crystallization of Ba-ferrite films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; COERCIVE FORCE; CRYSTALLIZATION; FILM GROWTH; MAGNETIZATION; MAGNETRON SPUTTERING; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; X RAY SCATTERING;

EID: 0032621681     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370993     Document Type: Article
Times cited : (38)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.