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Volumn 86, Issue 4, 1999, Pages 1958-1964
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Thickness dependence of the crystallization of Ba-ferrite films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BARIUM COMPOUNDS;
COERCIVE FORCE;
CRYSTALLIZATION;
FILM GROWTH;
MAGNETIZATION;
MAGNETRON SPUTTERING;
SAPPHIRE;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
THIN FILMS;
X RAY SCATTERING;
FIELD EMISSION SCANNING ELECTRON MICROSCOPY;
SYNCHROTRON X RAY SCATTERING;
AMORPHOUS FILMS;
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EID: 0032621681
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.370993 Document Type: Article |
Times cited : (38)
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References (22)
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