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Volumn 282-283, Issue , 1998, Pages 47-56

Nonequilibrium plasmas for material processing in microelectronics

Author keywords

Capacitively Coupled Plasma; Inductively Coupled Plasma; Ionization; Plasma Chemistry; Plasma Deposition; Plasma Etching; Rf Discharges; Thin Films

Indexed keywords

INTEGRATED CIRCUIT MANUFACTURE; MICROELECTRONIC PROCESSING; PLASMA ETCHING; REACTIVE ION ETCHING; ULSI CIRCUITS;

EID: 0007364076     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.282-283.47     Document Type: Article
Times cited : (8)

References (31)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.