Carrier distribution and relaxation-induced defects of InAs/GaAs quantum dots

Applied Physics Letters

Volumn 77, Issue 19, 2000, Pages 3027-3029

  Wang, J S ^a   Chen, J F ^a   Huang, J L ^a   Wang, P Y ^a   Guo, X J ^b  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006339382     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1323735     Document Type: Article

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