Spatial resolution of capacitance-voltage profiles in quantum well structures

Applied Physics Letters

Volumn 72, Issue 10, 1998, Pages 1196-1198

  Moon, C R ^a   Choe, Byung Doo ^a   Kwon, S D ^b   Lim, H ^b  

^a Seoul National University   (South Korea)

^b Ajou University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007679490     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121011     Document Type: Article

References (10)

1. H. Kroemer and W.-Y. Chien, Solid-State Electron. 24, 655 (1981).
2. P. Blood and J. W. Orton, The Electrical Characterization of Semiconductors. Majority Carriers and Electron States (Academic, New York, 1992), Chaps. 5 and 6.
3. E. F. Schubert, R. F. Kopf, J. M. Kuo, H. S. Luftman, and P. A. Garbinski, Appl. Phys. Lett. 57, 497 (1990).
4. For more details, see E. F. Schubert, Epitaxial Microstructures, edited by A. C. Gossard (Academic, New York, 1994), Chap. 1
5. E. F. Schubert, Doping in III-V Semiconductors (Cambridge University, New York, 1993), and references therein.
6. N. Yamamoto, K. Yokoyama, and M. Yamamoto, Appl. Phys. Lett. 62, 252 (1993).
7. C. R. Moon, B. D. Choe, S. D. Kwon, and H. Lim, Appl. Phys. Lett. 70, 2987 (1997).
8. C. R. Moon, I. Kim, J. S. Lee, B. D. Choe, S. D. Kwon, and H. Lim, Appl. Phys. Lett. 70, 3284 (1997).
9. J. E. A. Whiteaway, IEE Proc.-J: Optoelectron. 130, 165 (1983).
10. I. H. Tan, G. L. Snider, L. D. Chang, and E. L. Hu, J. Appl. Phys. 68, 4071 (1990).