Island growth and surface roughness scaling of epitaxial gaas on si observed by in situ scanning electron microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 23, 1999, Pages 15240-15245

  Finnie, Paul ^a   Homma, Yoshikazu ^a  

^a Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0006323037     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.15240     Document Type: Article

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