Micro-Raman scattering and x-ray diffraction studies of (Ta2O5)1-x(TiO2)x ceramics

Journal of Applied Physics

Volumn 87, Issue 12, 2000, Pages 8688-8694

  Dobal, P S ^a   Katiyar, R S ^a   Jiang, Y ^b   Guo, R ^b   Bhalla, A S ^b  

^a UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005888942     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373597     Document Type: Article

References (41)

1. F. Chiu, J. Way, J. Y. Lee, and S. C. Wu, J. Appl. Phys. 81, 6911 (1997).
2. R. F. Cava and J. J. Krajewski, J. Appl. Phys. 83, 1613 (1998).
3. S. W. Park, Y. K. Back, J. Y. Lee, C. O. Park, and H. B. Im, J. Electron. Mater. 21, 635 (1992).
4. R. F. Cava, W. J. Peck, Jr., and J. J. Krajewski, Nature (London) 377, 215 (1995).
5. K. Yamagishi and Y. Tarui, Jpn. J. Appl. Phys., Part 2 25, L306 (1986).
6. G. Q. Lo, D. L. Kwong, and S. Lee, Appl. Phys. Lett. 60, 3286 (1992), 62, 973 (1993).
7. G. Q. Lo, D. L. Kwong, and S. Lee, Appl. Phys. Lett. 60, 3286 (1992), 62, 973 (1993).
8. K. Sundaram, W. K. Choi, and C. H. Ling, Thin Solid Films 230, 95 (1993).
9. S. Ezhilvalavan and T.-Y. Tseng, Appl. Phys. Lett. 74, 2477 (1999); J. Mater. Sci.: Mater. Electron. 10, 9 (1999).
10. S. Ezhilvalavan and T.-Y. Tseng, Appl. Phys. Lett. 74, 2477 (1999); J. Mater. Sci.: Mater. Electron. 10, 9 (1999).
11. Y. S. Kim, Y. H. Lee, K. M. Lim, and M. Y. Sung, Appl. Phys. Lett. 74, 2800 (1999).
12. P. G. Clem, N. L. Jeon, R. G. Nuzzo, and D. A. Payne, J. Am. Ceram. Soc. 80, 2821 (1997).
13. G. A. A.-Jumaily and S. M. Edlou, Thin Solid Films 209, 223 (1992).
14. J. F. Meng, B. K. Rai, R. S. Katiyar, and A. S. Bhalla, J. Phys. Chem. Solids 58, 1503 (1997).
15. S. Lagergren and A. Magneli, Acta Chem. Scand. 6, 444 (1952).
16. A. Reisman, F. Holtzberg, M. Berkenblit, and M. Berry, J. Am. Chem. Soc. 78, 4514 (1956).
17. F. Laves and W. Petter, Helv. Phys. Acta 37, 617 (1964).
18. J. L. Waring and R. S. Roth, J. Res. Natl. Bur. Stand., Sect. A 72, 175 (1968).
19. R. S. Roth, J. L. Waring, and W. S. Brower, J. Res. Natl. Bur. Stand., Sect. A 74, 485 (1970).
20. F. Laves, R. Moser, and W. Petter, Naturwissenschaften 52, 617 (1965).
21. S. Anderson, Ark. Kemi 26, 521 (1967).
22. A. Pignolet, G. M. Rao, and S. B. Krupanidhi, Thin Solid Films 258, 230 (1995).
23. B. R. Jooste and H. J. Viljoen, J. Mater. Res. 13, 475 (1998).
24. A. A. Eliseen, N. B. Gorilovskaya, V. N. Tsygankov, and V. A. Tolstova, Russ. J. Inorg. Chem. 34, 1530 (1989).
25. S. Schmidt, R. L. Withers, and J. G. Thompson, J. Solid State Chem. 99, 226 (1992).
26. V. Bhide, E. Husson, and M. Gasperin, Mater. Res. Bull 15, 1339 (1980).
27. A. A. McConnell, J. S. Anderson, and C. N. R. Rao, Spectrochim. Acta A 32A, 1067 (1976).
28. A. L. Gubskil, A. P. Kovtun, and S. D. Khanin, Sov. Phys. Solid State 29, 611 (1987).
29. A. L. Gubskil and S. D. Khanin, Sov. Phys. Solid State 31, 442 (1989); ibid. 32, 1324 (1990).
30. A. L. Gubskil and S. D. Khanin, Sov. Phys. Solid State 31, 442 (1989); ibid. 32, 1324 (1990).
31. M. I. Alonso and K. Winer, Phys. Rev. B 39, 10056 (1989).
32. U. Balachandran and N. G. Eror, J. Solid State Chem. 42, 276 (1982).
33. Y. Hara and M. Nicol, Phys. Status Solidi B 94, 317 (1979).
34. R. Guo, Y. Jiang, and A. S. Bhalla, Ferroelect. Lett. Sect. (to be published).
35. W. Cochran, Adv. Phys. 9, 387 (1960); 10, 401 (1061); 18, 157 (1969).
36. W. Cochran, Adv. Phys. 9, 387 (1960); 10, 401 (1061); 18, 157 (1969).
37. W. Cochran, Adv. Phys. 9, 387 (1960); 10, 401 (1061); 18, 157 (1969).
38. J. F. Scott, Phys. Rev. Lett. 21, 907 (1968).
39. H. Bakker, Phys. Status Solidi B 44, 369 (1971).
40. I. Fedorov, J. Petzelt, V. Zelenzy, G. A. Komandin, A. A. Volkov, K. Brooks, Y. Huang, and N. Setter, J. Phys.: Condens. Matter 7, 4313 (1995).
41. J-Y. Gan, Y. C. Chang, and T. B. Wu, Appl. Phys. Lett. 72, 332 (1998).