-
1
-
-
0346951429
-
-
E. V. Thomsen, O. Hanson, K. Harrekilde-Petersen, J. L. Hansen, S. Y. Shiryaev, and A. N. Larsen, J. Vac. Sci. Technol. B 12, 3016 (1994).
-
(1994)
J. Vac. Sci. Technol. B
, vol.12
, pp. 3016
-
-
Thomsen, E.V.1
Hanson, O.2
Harrekilde-Petersen, K.3
Hansen, J.L.4
Shiryaev, S.Y.5
Larsen, A.N.6
-
3
-
-
0001016899
-
-
P. M. Rousseau, P. B. Griffin, W. T. Fang, and J. D. Plummer, J. Appl. Phys. 84, 3593 (1998).
-
(1998)
J. Appl. Phys.
, vol.84
, pp. 3593
-
-
Rousseau, P.M.1
Griffin, P.B.2
Fang, W.T.3
Plummer, J.D.4
-
4
-
-
5444262235
-
-
A. Nylandsted Larsen, F. T. Pedersen, G. Weyer, R. Galloni, R. Rizzoli, and A. Armigliato, J. Appl. Phys. 59, 1908 (1986).
-
(1986)
J. Appl. Phys.
, vol.59
, pp. 1908
-
-
Nylandsted Larsen, A.1
Pedersen, F.T.2
Weyer, G.3
Galloni, R.4
Rizzoli, R.5
Armigliato, A.6
-
5
-
-
0000657992
-
-
D. Nobili, S. Solmi, A. Parisini, M. Derdour, A. Armigliato, and L. Moro, Phys. Rev. B 49, 2477 (1994).
-
(1994)
Phys. Rev. B
, vol.49
, pp. 2477
-
-
Nobili, D.1
Solmi, S.2
Parisini, A.3
Derdour, M.4
Armigliato, A.5
Moro, L.6
-
6
-
-
0000711874
-
-
K. C. Pandey, A. Erbil, G. S. Cargill, and R. F. Boehme, Phys. Rev. Lett. 61, 1282 (1988).
-
(1988)
Phys. Rev. Lett.
, vol.61
, pp. 1282
-
-
Pandey, K.C.1
Erbil, A.2
Cargill, G.S.3
Boehme, R.F.4
-
9
-
-
0001547107
-
-
J. L. Allain, J. R. Regnard, A. Bourret, A. Parisini, A. Armigliato, G. Tourillon, and S. Pizzini, Phys. Rev. B 46, 9434 (1992).
-
(1992)
Phys. Rev. B
, vol.46
, pp. 9434
-
-
Allain, J.L.1
Regnard, J.R.2
Bourret, A.3
Parisini, A.4
Armigliato, A.5
Tourillon, G.6
Pizzini, S.7
-
10
-
-
0001010910
-
-
K. Saarinen, J. Nissilä, H. Kauppinen, M. Hakala, M. J. Pusaka, P. Hautojärvi, and C. Corbel, Phys. Rev. Lett. 82, 1883 (1999).
-
(1999)
Phys. Rev. Lett.
, vol.82
, pp. 1883
-
-
Saarinen, K.1
Nissilä, J.2
Kauppinen, H.3
Hakala, M.4
Pusaka, M.J.5
Hautojärvi, P.6
Corbel, C.7
-
12
-
-
0003597024
-
-
Properties of Silicon, INSPEC, The Institute of Electrical Engineers, London
-
D. Nobili, in Properties of Silicon, EMIS Data Reviews Series, No. 4 (INSPEC, The Institute of Electrical Engineers, London, 1988), pp. 398, 401.
-
(1988)
EMIS Data Reviews Series
, vol.4
, pp. 398
-
-
Nobili, D.1
-
14
-
-
0011994780
-
-
A. Armigliato, F. Romanato, A. Drigo, A. Carnera, C. Brizard, J. R. Regnard, and J. L. Allain, Phys. Rev. B 52, 1859 (1995).
-
(1995)
Phys. Rev. B
, vol.52
, pp. 1859
-
-
Armigliato, A.1
Romanato, F.2
Drigo, A.3
Carnera, A.4
Brizard, C.5
Regnard, J.R.6
Allain, J.L.7
-
15
-
-
0005799947
-
-
P. Gaiduk, J. Fage-Pedersen, J. Lundsgaard Hansen, and A. Nylandsted Larsen, Phys. Rev. B 59, 7278 (1999).
-
(1999)
Phys. Rev. B
, vol.59
, pp. 7278
-
-
Gaiduk, P.1
Fage-Pedersen, J.2
Lundsgaard Hansen, J.3
Nylandsted Larsen, A.4
-
16
-
-
0001572772
-
-
D. J. Chadi, C. H. Park, D. L. Adler, M. A. Marcus, and H.-J. Gossmann, Phys. Rev. Lett. 79, 4834 (1997).
-
(1997)
Phys. Rev. Lett.
, vol.79
, pp. 4834
-
-
Chadi, D.J.1
Park, C.H.2
Adler, D.L.3
Marcus, M.A.4
Gossmann, H.-J.5
-
17
-
-
0000085788
-
-
J. L. Benton, S. Libertino, P. Kringhøj, D. J. Eaglesham, J. M. Poate, and S. Coffa, J. Appl. Phys. 82, 120 (1997).
-
(1997)
J. Appl. Phys.
, vol.82
, pp. 120
-
-
Benton, J.L.1
Libertino, S.2
Kringhøj, P.3
Eaglesham, D.J.4
Poate, J.M.5
Coffa, S.6
-
21
-
-
0000077773
-
-
H. Rücker, B. Heinemann, W. Röpke, R. Kurps, G. Lippert, and J. H. Osten, Appl. Phys. Lett. 73, 1682 (1998).
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 1682
-
-
Rücker, H.1
Heinemann, B.2
Röpke, W.3
Kurps, R.4
Lippert, G.5
Osten, J.H.6
-
26
-
-
85037497123
-
-
note
-
nV complexes, n = 2.3.4 have been suggested (Ref. 8) to remove the same number of electrons, viz. 4, from the conduction band.
-
-
-
-
27
-
-
4243440802
-
-
J. Fage-Pedersen, A. Nylandsted Larsen, P. Gaiduk, J. Lundsgaard Hansen, and M. Linnarsson, Phys. Rev. Lett. 81, 5856 (1998).
-
(1998)
Phys. Rev. Lett.
, vol.81
, pp. 5856
-
-
Fage-Pedersen, J.1
Nylandsted Larsen, A.2
Gaiduk, P.3
Lundsgaard Hansen, J.4
Linnarsson, M.5
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